DSpace DSpace 日本語

AIT Associated Repository of Academic Resources >
A.研究報告 >
A1 愛知工業大学研究報告 >
3.愛知工業大学研究報告 .B(1976-2007) >
27号 >

Please use this identifier to cite or link to this item: http://hdl.handle.net/11133/893

Title: パーソナルコンピュータを用いた半導体中トラップの評価システムの製作
Other Titles: パーソナル コンピュータ オ モチイタ ハンドウタイチュウ トラップ ノ ヒョウカ システム ノ セイサク
Development of Evaluation System of Deep Traps in Semiconductors by Using Personal Computer
Authors: 徳田, 豊
下方, 稔久
TOKUDA, Yutaka
SHIMOKATA, Toshihisa
Issue Date: 31-Mar-1992
Publisher: 愛知工業大学
Abstract: Evaluation system of deep traps in pn and Schottky junctions, and MOS structures was developed by using personal computer. Deep level transient spectroscopy and weighted capacitance transient spectroscopy measurements are made by using this system. Zerbst and Schroder analyses are also performed for MOS structures. This simple measurement system can provide useful technique to detect traps in semiconductors.
URI: http://hdl.handle.net/11133/893
Appears in Collections:27号

Files in This Item:

File Description SizeFormat
紀要27号B(P23-29).pdf731.17 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.


Valid XHTML 1.0! DSpace Software Copyright © 2002-2010  Duraspace - Feedback