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Please use this identifier to cite or link to this item: http://hdl.handle.net/11133/3061

Title: シリコン単結晶の室温における静的曲げ及び疲労
Other Titles: シリコン タンケッショウ ノ シツオン ニオケル セイテキ マゲ オヨビ ヒロウ
Bending and fatigue of silicon single crystal at room temperature
Authors: 高木, 誠
松室, 昭仁
岩田, 博之
坂, 公恭
TAKAGI, Makoto
IWATA, Hiroyuki
SAKA, Hiroyasu
Issue Date: 30-Sep-2015
Publisher: 愛知工業大学
Abstract: The static four-point and three-point bending tests and the fatigue test of the silicon single crystal wafer specimens were carried out at room temperature After the tests,the specimens were investigated by the cross-sectional TEM observations in order to clarify the microstructural change. The cross sectional TEM observations indicated that the residual strain was caused in all of the specimens,and the dislocations were also observed after the fatigue tests.
URI: http://hdl.handle.net/11133/3061
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