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Please use this identifier to cite or link to this item: http://hdl.handle.net/11133/2095

Title: 原子的構造解析システムの現状と課題(II)
Other Titles: ゲンシテキ コウゾウ カイセキ システム ノ ゲンジョウ ト カダイ Ⅱ
Current Status and Future Agenda in“Atomic Structure Analyzing System”
Authors: 岩田, 博之
高木, 誠
平野, 正典
山田, 英介
渡辺, 藤雄
落合, 鎮康
澤木, 宣彦
IWATA, Hiroyuki
TAKAGI, Makoto
HIRANO, Masanori
YAMADA, Eisuke
WATANABE, Fujio
OCHIAI, Shizuyasu
SAWAKI, Nobuhiko
Issue Date: 27-Sep-2012
Publisher: 愛知工業大学
Abstract: In Research Institute for Industrial Technology,Aichi Institute Technology, a TEM CCD-camera (Orius SC1000) has been installed in the transmission electron micro-scope (JEOL JEM-2010). This camera mounted at the bottom of the system allows the user to view and record easily high resolution images. And it offers high speed (> 14 fps) image viewing mode, and capability of high quality TEM in-situ observation. In addition,two computer-controlled sample-preparation systems have been equipped recently. By the ion slicer system (JEOL EM-9100IS) we can prepare thin-film specimens faster and easier than before,where low-angle Ar ion beam irradiates the specimens using a thin shield belt. The Gentle Mill 3 (IV8) can eliminate surface damage caused by the high-energy ion beam irradiation to represent real crystal structure instead of artifacts in TEM analyses.
URI: http://hdl.handle.net/11133/2095
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