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Please use this identifier to cite or link to this item: http://hdl.handle.net/11133/1441

Title: 位相変調を用いた半導体レーザのスペクトル線幅測定法
Other Titles: イソウ ヘンチョウ ヲ モチイタ ハンドウタイ レーザ ノ スペクトル センプク ソクテイ ホウ
Spectral Linewidth Measurement of Semiconductor Laser Diodes By Phase Modulation Technique
Authors: 森, 正和
岩井, 真人
後藤, 了祐
MORI, Masakazu
IWAI, Masato
GOTO, Ryosuke
Issue Date: 31-Mar-2009
Publisher: 愛知工業大学
Abstract: Methods to measure spectral linewidths of semiconductor laser diodes are investigated. Firstly, methods which realize carrier-suppressed phase modulation are experimented. Secondly, a method which utilizes a phase modulator with an ultrasonic transducer is developed. By combining a fiber loop mirror, the carrier component is suppressed by more than 20dB, and the lasing spectral component can be monitored up to 35dB or more. The method is of low cost and versatile to measure spectral linewidths of semiconductor laser diodes less than several MHz. The principle of the operation and characteristics are described in detail.
URI: http://hdl.handle.net/11133/1441
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